الكتاب الالكتروني Test and Design-for-Testability in Mixed-Signal Integrated Circuits ، تحميل الكتاب الالكتروني Test and Design-for-Testability in Mixed-Signal Integrated Circuits ، الكتاب الالكتروني Test and Design-for-Testability in Mixed-Signal Integrated Circuits ، الكتاب الالكتروني Test and Design-for-Testability in Mixed-Signal Integrated Circuits على أكثر من سيرفر ، الكتاب الالكتروني Test and Design-for-Testability in Mixed-Signal Integrated Circuits pdf
Test and Design-for-Testability in Mixed-Signal Integrated Circuits By Jose Luis Huertas Diaz
2004 | 316 Pages | ISBN: 1441954228 | PDF | 10 MB
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses.
تحميل الكتاب الالكتروني
Test and Design-for-Testability in Mixed-Signal Integrated Circuits By Jose Luis Huertas Diaz
2004 | 316 Pages | ISBN: 1441954228 | PDF | 10 MB
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses.
تحميل الكتاب الالكتروني